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  Charge separation and recombination in radial ZnO/In2S3/CuSCN heterojunction structures

Tornow, J., Schwarzburg, K., Belaidi, A., Dittrich, T., Kunst, M., & Hannappel, T. (2010). Charge separation and recombination in radial ZnO/In2S3/CuSCN heterojunction structures. Journal of Applied Physics, 108(4): 044915. doi:10.1063/1.3466776.

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 Creators:
Tornow, Julian1, Author           
Schwarzburg, Klaus2, Author
Belaidi, Abdelhak2, Author
Dittrich, Thomas2, Author
Kunst, Marinus2, Author
Hannappel, Thomas2, Author
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
2Helmholtz Zentrum Berlin, Hahn-Meitner-Platz 1, 14109 Berlin, Germany, ou_persistent22              

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Free keywords: annealing; charge injection; copper compounds; II-VI semiconductors; indium compounds; nanorods; photoconductivity; photovoltaic effects; semiconductor-insulator-semiconductor structures; sulphur compounds; wide band gap semiconductors; zinc compounds
 Abstract: A ZnO-nanorod/In2S3/CuSCN radial heterostructure has recently shown promising photovoltaic conversion efficiencies. In this work, the charge separation and recombination in single ZnO/In2S3 and In2S3/CuSCN interfaces as well as the complete ZnO/In2S3/CuSCN structure were studied by time resolved microwave photoconductivity. Photoconductivity transients were measured for different thicknesses of the In2S3 light absorbing layer, under variation in the exciting light flux and before and after annealing of the ZnO nanorods at 450 °C. Upon excitation with 532 nm light, a long lived (millisecond) charge separation at the In2S3/ZnO interface was found, whereas no charge separation was present at the In2S3/CuSCN interface. The presence of the CuSCN hole conductor increased the initial amplitude of the time resolved microwave conductivity signal of the In2S3/ZnO interface by a factor of 8 for a 6 nm thick In2S3 layer, but the enhancement in amplitude dropped strongly for thicker films. The measurements show that the primary charge separation is located at the In2S3/ZnO interface but the charge injection yield into ZnO depends critically on the presence of CuSCN.

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Language(s): eng - English
 Dates: 2010-06-222010-08-31
 Publication Status: Published online
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.3466776
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Title: Journal of Applied Physics
Source Genre: Journal
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Publ. Info: New York, NY : American Institute of Physics
Pages: - Volume / Issue: 108 (4) Sequence Number: 044915 Start / End Page: - Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880