Strong-field double ionization of Ar below the recollision threshold

Liu, Y. Q.; Tschuch, S.; Rudenko, A.; Dürr, M.; Siegel, M.; Morgner, U.; Moshammer, R.; Ullrich, J.

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Strong-field double ionization of Ar below the recollision threshold

Liu, Y. Q., Tschuch, S., Rudenko, A., Dürr, M., Siegel, M., Morgner, U., et al. (2008). Strong-field double ionization of Ar below the recollision threshold. Physical Review Letters, 101(5): 053001, pp. 1-4.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-78C7-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-78C8-0

Genre: Journal Article

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Creators:
Liu, Y. Q.¹, Author
Tschuch, S.¹, Author
Rudenko, A.¹, Author
Dürr, M.¹, Author
Siegel, M.¹, Author
Morgner, U.¹, Author
Moshammer, R.¹, Author
Ullrich, J.¹, Author

Affiliations:
1Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547

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Language(s): eng - English

Dates: Date issued: 2008-08-01

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 391123
ISI: 000258384700014

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Title: Physical Review Letters

Alternative Title : Phys. Rev. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 101 (5) Sequence Number: 053001 Start / End Page: 1 - 4 Identifier: ISSN: 0031-9007