Potential energy threshold for nano-hillock formation by impact of slow highly 
charged ions on a CaF2(111) surface

El-Said, A. S.; Meissl, W.; Simon, M. C.; Crespo López-Urrutia, J. R.; Lemell, C.; Burgdörfer, J.; Gebeshuber, I. C.; Winter, H. P.; Ullrich, J.; Trautmann, C.; Toulemonde, M.; Aumayr, F.

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Potential energy threshold for nano-hillock formation by impact of slow highly charged ions on a CaF2(111) surface

El-Said, A. S., Meissl, W., Simon, M. C., Crespo López-Urrutia, J. R., Lemell, C., Burgdörfer, J., et al. (2007). Potential energy threshold for nano-hillock formation by impact of slow highly charged ions on a CaF2(111) surface. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, 258(1), 167-171.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-7D58-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-7D59-D

Genre: Journal Article

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Creators:
El-Said, A. S.¹, Author
Meissl, W.¹, Author
Simon, M. C.², Author
Crespo López-Urrutia, J. R.², Author
Lemell, C.¹, Author
Burgdörfer, J.¹, Author
Gebeshuber, I. C.¹, Author
Winter, H. P.¹, Author
Ullrich, J.², Author
Trautmann, C.¹, Author
Toulemonde, M.¹, Author
Aumayr, F.¹, Author

Affiliations:
1Vienna Univ Technol, Inst Allgemeine Phys, A-1040 Vienna, Austria.; Vienna Univ Technol, Inst Theoret Phys, A-1040 Vienna, Austria.; GSI, D-64291 Darmstadt, Germany.; UCBN, CNRS, CEA, ENSICAEN,CIRIL,Lab Commun, F-14070 Caen 5, France., ou_persistent22
2Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547

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Language(s): eng - English

Dates: Date issued: 2007-05

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 336337
ISI: 000246457200037

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Title: Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms

Alternative Title : Nucl. Instrum. Methods Phys. Res. Sect. B-Beam Interact. Mater. Atoms

Source Genre: Journal

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Pages: - Volume / Issue: 258 (1) Sequence Number: - Start / End Page: 167 - 171 Identifier: ISSN: 0168-583X