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  The Freiburg Electron Beam Ion Trap/Source Project: FREBIT

Crespo López-Urrutia, J., Bapat, B., Dorn, A., Moshammer, R., Schröter, C., & Ullrich, J. (2001). The Freiburg Electron Beam Ion Trap/Source Project: FREBIT. In J. Gillaspy (Ed.), Trapping Highly Charged Ions: Fundamentals and Applications (pp. 103). Huntington, New York: Nova Science Publishers.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-85C3-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-85C4-D
Genre: Book Chapter

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 Creators:
Crespo López-Urrutia, J.R.1, Author           
Bapat, B.1, Author           
Dorn, A.1, Author           
Moshammer, R.1, Author           
Schröter, C.D.1, Author           
Ullrich, J.1, Author           
Affiliations:
1Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              

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Language(s): eng - English
 Dates: 2001
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 60281
 Degree: -

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Title: Trapping Highly Charged Ions: Fundamentals and Applications
Source Genre: Book
 Creator(s):
Gillaspy, J.D., Editor
Affiliations:
-
Publ. Info: Huntington, New York : Nova Science Publishers
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 103 Identifier: ISBN: 1-560-72725-X