English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Enhanced Radiation Hardness and Faster Front Ends for the Beetle Readout Chip

van Bakel, N., van den Brand, J., Verkooijen, H., Bauer, C., Baumeister, D., Hofmann, W., et al. (2001). Enhanced Radiation Hardness and Faster Front Ends for the Beetle Readout Chip. In Proceedings of the 7th Workshop on Electronics for LHC Experiments (pp. 57-61).

Item is

Files

show Files
hide Files
:
LHCC2001-034.57-61.pdf (Publisher version), 263KB
Name:
LHCC2001-034.57-61.pdf
Description:
-
OA-Status:
Visibility:
Public
MIME-Type / Checksum:
application/pdf / [MD5]
Technical Metadata:
Copyright Date:
-
Copyright Info:
eDoc_access: PUBLIC
License:
-

Locators

show

Creators

show
hide
 Creators:
van Bakel, Niels1, Author
van den Brand, Jo1, Author
Verkooijen, Hans1, Author
Bauer, Christian2, Author           
Baumeister, Daniel2, Author           
Hofmann, Werner2, Author           
Knoepfle, Karl-Tasso2, Author           
Loechner, Sven2, Author           
Schmelling, Michael2, Author           
Sexauer, Edgar2, Author           
Feuerstack-Raible, Martin1, Author
Trunk, Ulrich2, Author           
Harnew, Neville1, Author
Smale, Nigel2, Author           
Affiliations:
1Free University of Amsterdam, Netherlands; NIKHEF Amsterdam, Netherlands; University of Heidelberg, Germany; University of Oxford, UK., ou_persistent22              
2Division Prof. Dr. Werner Hofmann, MPI for Nuclear Physics, Max Planck Society, ou_904550              

Content

show
hide
Free keywords: -
 Abstract: This paper summarizes the recent progress in the development of the 128 channel pipelined readout chip Beetle, which is intended for the silicon vertex detector, the inner tracker, the pile-up veto trigger and the RICH detectors of LHCb. Deficiencies found in the front end of the Beetle Version 1.0 and 1.1 chips resulted in the submissions of BeetleFE 1.1 and BeetleFE 1.2, while BeetleSR 1.0 implements test circuits to provide future Beetle chips with logic circuits hardened against single event upset (SEU). Section I. motivates the development of new front ends for the Beetle chip, and section II. summarizes their concepts and construction. Section III. reports preliminary results from the BeetleFE 1.1 and BeetleFE 1.2 chips, while section IV. describes the BeetleSR 1.0 chip. An outlook on future test and development of the Beetle chip is given in section V.

Details

show
hide
Language(s): eng - English
 Dates: 2001
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 63168
 Degree: -

Event

show
hide
Title: 7th Workshop on Electronics for LHC Experiments
Place of Event: Stockholm, Sweden
Start-/End Date: 2001-09-10 - 2001-09-14

Legal Case

show

Project information

show

Source 1

show
hide
Title: Proceedings of the 7th Workshop on Electronics for LHC Experiments
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 57 - 61 Identifier: -

Source 2

show
hide
Title: CERN/LHCC 2001-034
Source Genre: Series
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: - Identifier: -