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  Semiconductor detectors for (imaging) X-ray spectroscopy

Strüder, L., Lutz, G., Lechner, P., Soltau, H., & Holl, P. (2005). Semiconductor detectors for (imaging) X-ray spectroscopy. In K. Tsuji, J. Injuk, & R. V. Grieken (Eds.), X-Ray Spectrometry: Recent Technological Advances (pp. 133-193). Chichester, UK: Wiley.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0011-DDF3-7 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0011-DDF4-5
Genre: Book Chapter

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 Creators:
Strüder, L.1, Author              
Lutz, G.1, Author              
Lechner, P., Author
Soltau, H., Author
Holl, P., Author
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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Language(s): eng - English
 Dates: 2005
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: eDoc: 398672
Other: PH 130/34, p.133-193
 Degree: -

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Title: X-Ray Spectrometry: Recent Technological Advances
Source Genre: Book
 Creator(s):
Tsuji, K., Editor
Injuk, J., Editor
Grieken, R. Van, Editor
Affiliations:
-
Publ. Info: Chichester, UK : Wiley
Pages: 603 p. Volume / Issue: - Sequence Number: 4.1 Start / End Page: 133 - 193 Identifier: ISBN: 978-0-471-48640-4