Semiconductor detectors for (imaging) X-ray spectroscopy

Strüder, L.; Lutz, G.; Lechner, P.; Soltau, H.; Holl, P.

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Semiconductor detectors for (imaging) X-ray spectroscopy

Strüder, L., Lutz, G., Lechner, P., Soltau, H., & Holl, P. (2005). Semiconductor detectors for (imaging) X-ray spectroscopy. In K. Tsuji, J. Injuk, & R. V. Grieken (Eds.), X-Ray Spectrometry: Recent Technological Advances (pp. 133-193). Chichester, UK: Wiley.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-DDF3-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-DDF4-5

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Creators:
Strüder, L.¹, Author
Lutz, G.¹, Author
Lechner, P., Author
Soltau, H., Author
Holl, P., Author

Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 398672
Other: PH 130/34, p.133-193

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Title: X-Ray Spectrometry: Recent Technological Advances

Source Genre: Book

Creator(s):
Tsuji, K., Editor
Injuk, J., Editor
Grieken, R. Van, Editor

Affiliations:
-

Publ. Info: Chichester, UK : Wiley

Pages: 603 p. Volume / Issue: - Sequence Number: 4.1 Start / End Page: 133 - 193 Identifier: ISBN: 978-0-471-48640-4