Analysis of background events in Silicon Drift Detectors

Eggert, T.; Goldstrass, P.; Kemmer, J.; Pahlke, A.

doi:10.1016/S0168-9002(03)01902-8

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Analysis of background events in Silicon Drift Detectors

Eggert, T., Goldstrass, P., Kemmer, J., & Pahlke, A. (2003). Analysis of background events in Silicon Drift Detectors. Nuclear Instruments and Methods in Physics Research Section A, 512(1-2), 257-264.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-E856-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-8080-E

Genre: Conference Paper

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Creators:
Eggert, T., Author
Goldstrass, P., Author
Kemmer, J., Author
Pahlke, A.¹, Author

Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 63173
DOI: 10.1016/S0168-9002(03)01902-8
Other: 7676

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Title: Proceedings of the 9th European Symposium on Semiconductor Detect ors: New Developments on Radiation Detectors

Place of Event: Elmau, Germany

Start-/End Date: 2003-10-11 - 2003-10-11

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Title: Nuclear Instruments and Methods in Physics Research Section A

Alternative Title : Nucl. Instrum. & Methods Phys. Res. Sect. A

Source Genre: Journal

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Pages: - Volume / Issue: 512 (1-2) Sequence Number: - Start / End Page: 257 - 264 Identifier: ISSN: 0168-9002