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  Analysis of background events in Silicon Drift Detectors

Eggert, T., Goldstrass, P., Kemmer, J., & Pahlke, A. (2003). Analysis of background events in Silicon Drift Detectors. Nuclear Instruments and Methods in Physics Research Section A, 512(1-2), 257-264.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0011-E856-7 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0028-8080-E
Genre: Conference Paper

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 Creators:
Eggert, T., Author
Goldstrass, P., Author
Kemmer, J., Author
Pahlke, A.1, Author              
Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890              

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Language(s): eng - English
 Dates: 2003
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 63173
DOI: 10.1016/S0168-9002(03)01902-8
Other: 7676
 Degree: -

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Title: Proceedings of the 9th European Symposium on Semiconductor Detect ors: New Developments on Radiation Detectors
Place of Event: Elmau, Germany
Start-/End Date: 2003-10-11 - 2003-10-11

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Title: Nuclear Instruments and Methods in Physics Research Section A
  Alternative Title : Nucl. Instrum. & Methods Phys. Res. Sect. A
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 512 (1-2) Sequence Number: - Start / End Page: 257 - 264 Identifier: ISSN: 0168-9002