Measurements of high energy loss rates of fast highly charged U ions channeled 
in thin silicon crystals

Ray, C.; Braeuning-Demian, A.; Braeuning, H.; Chevallier, M.; Cohen, C.; Dauvergne, D.; L'Hoir, A.; Kozhuharov, C.; Liesen, D.; Mokler, P. H.; Poizat, J. -C.; Stoehlker, Th; Testa, E.; Toulemonde, M.

doi:10.1103/PhysRevB.84.024119

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Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals

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Mokler, P. H.
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Ray, C., Braeuning-Demian, A., Braeuning, H., Chevallier, M., Cohen, C., Dauvergne, D., et al. (2011). Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals. Physical review B, 84(2): 024119. doi:10.1103/PhysRevB.84.024119.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-1339-8

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