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Conference Paper

Fast and Robust Detection of Crest Lines on Meshes

MPS-Authors
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Yoshizawa,  Shin
Computer Graphics, MPI for Informatics, Max Planck Society;

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Belyaev,  Alexander
Computer Graphics, MPI for Informatics, Max Planck Society;

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Seidel,  Hans-Peter       
Computer Graphics, MPI for Informatics, Max Planck Society;

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spm05ybs.pdf
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Citation

Yoshizawa, S., Belyaev, A., & Seidel, H.-P. (2005). Fast and Robust Detection of Crest Lines on Meshes. In L. Kobbelt, & V. Shapiro (Eds.), Proceedings of the Ninth ACM Symposium on Solid and Physical Modeling 2005 (pp. 227-232). New York, USA: ACM.


Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-2686-E
Abstract
We propose a fast and robust method for detecting
crest lines on surfaces approximated by dense triangle meshes.
The crest lines, salient surface features defined via first- and
second-order curvature derivatives, are widely used for shape
matching and interrogation purposes. Their practical extraction
is difficult because it requires good estimation of high-order
surface derivatives. Our approach to the crest line detection
is based on estimating the curvature tensor and curvature
derivatives via local polynomial fitting.
Since the crest lines are not defined in the surface regions
where the surface focal set (caustic) degenerates, we introduce
a new thresholding scheme which exploits interesting relationships
between curvature extrema, the so-called MVS functional of Moreton
and Sequin, and Dupin cyclides,
An application of the crest lines to adaptive mesh simplification
is also considered.