日本語
 
Help Privacy Policy ポリシー/免責事項
  詳細検索ブラウズ

アイテム詳細


公開

学術論文

Labeling and monitoring the distribution of anchoring sites on functionalized CNTs by atomic layer deposition

MPS-Authors
/persons/resource/persons22071

Schlögl,  Robert
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

/persons/resource/persons22243

Willinger,  Marc Georg
Department of Chemistry, CICECO, University of Aveiro;
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

External Resource
There are no locators available
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
フルテキスト (公開)

c2jm00088a.pdf
(出版社版), 2MB

付随資料 (公開)
There is no public supplementary material available
引用

Marichy, C., Tessonnier, J.-P., Ferro, M. C., Lee, K.-H., Schlögl, R., Pinna, N., & Willinger, M. G. (2012). Labeling and monitoring the distribution of anchoring sites on functionalized CNTs by atomic layer deposition. Journal of Materials Chemistry, 22(15), 7323-7330. doi:10.1039/C2JM00088A.


引用: https://hdl.handle.net/11858/00-001M-0000-000F-4C4B-F
要旨
The chemical inertness of graphite and, in the case of tubes, of rolled up few layer graphene sheets, requires some degree of “defect engineering” for the fabrication of carbon based heterostructured materials. It is shown that atomic layer deposition provides a means to specifically label anchoring sites and can be used to characterize the surface functionality of differently treated carbon nanotubes. Direct observation of deposited titania by analytical transmission electron microscopy reveals the location and density of anchoring sites as well as structure related concentrations of functional groups on the surface of the tubes. Controlled functionalization of the tubes therefore allows us to tailor the distribution of deposited material and, hence, fabricate complex heterostructures.