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Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons

MPS-Authors
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Weisser,  M.
MPI for Polymer Research, Max Planck Society;

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Menges,  B.
MPI for Polymer Research, Max Planck Society;

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Mittler-Neher,  Silvia
MPI for Polymer Research, Max Planck Society;

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Weisser, M., Menges, B., & Mittler-Neher, S. (1999). Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons. Sensors and Actuators B-Chemical, 56, 189-197.


Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-53BD-9
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