Determination of Micrometer Length Scales with an X-ray Reflection Ultra 
Small-Angle Scattering Set-Up

Müller-Buschbaum, P.; Casagrande, M.; Gutmann, Jochen S.; Kuhlmann, T.; Stamm, Manfred; von Krosigk, G.; Lode, U.; Cunis, S.; Gehrke, R.

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Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up

MPS-Authors

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Casagrande, M.
MPI for Polymer Research, Max Planck Society;

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Gutmann, Jochen S.
MPI for Polymer Research, Max Planck Society;

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Kuhlmann, T.
MPI for Polymer Research, Max Planck Society;

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Stamm, Manfred
MPI for Polymer Research, Max Planck Society;

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Müller-Buschbaum, P., Casagrande, M., Gutmann, J. S., Kuhlmann, T., Stamm, M., von Krosigk, G., et al. (1998). Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up. Europhysics Letters, 42, 517-522.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-5603-F

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