Static and dynamic profiles of tethered polymer layers probed by analyzing the 
noise of an atomic force microscope

Roters, A.; Gelbert, M.; Schimmel, M.; Rühe, Jürgen; Johannsmann, Diethelm

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Static and dynamic profiles of tethered polymer layers probed by analyzing the noise of an atomic force microscope

MPS-Authors

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Gelbert, M.
MPI for Polymer Research, Max Planck Society;

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Rühe, Jürgen
MPI for Polymer Research, Max Planck Society;

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Johannsmann, Diethelm
MPI for Polymer Research, Max Planck Society;

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Roters, A., Gelbert, M., Schimmel, M., Rühe, J., & Johannsmann, D. (1997). Static and dynamic profiles of tethered polymer layers probed by analyzing the noise of an atomic force microscope. Physical Review E, 56(3), 3256-3264.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-5818-4

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