Photoemission electron microscopy as a tool for the investigation of optical 
near fields

Cinchetti, M.; Gloskovskii, A.; Nepjiko, S. A.; Schönhense, G.; Rochholz, H.; Kreiter, Maximilian

doi:10.1103/PhysRevLett.95.047601

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Photoemission electron microscopy as a tool for the investigation of optical near fields

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Rochholz, H.
MPI for Polymer Research, Max Planck Society;

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Kreiter, Maximilian
MPI for Polymer Research, Max Planck Society;

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Cinchetti, M., Gloskovskii, A., Nepjiko, S. A., Schönhense, G., Rochholz, H., & Kreiter, M. (2005). Photoemission electron microscopy as a tool for the investigation of optical near fields. Physical Review Letters, 95(4): 047601. doi:10.1103/PhysRevLett.95.047601.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-5C42-D

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