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Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces

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Lorenz-Haas,  C.
MPI for Polymer Research, Max Planck Society;

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Cassignol,  C.
MPI for Polymer Research, Max Planck Society;

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Citation

Lorenz-Haas, C., Müller-Buschbaum, P., Wunnicke, O., Cassignol, C., Burghammer, M., Riekel, C., et al. (2003). Scanning microfocus small-angle X-ray scattering: A new tool to investigate defects at polymer-polymer interfaces. Langmuir, 19(7), 3056-3061. doi:10.1021/la026693+.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-6234-2
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