X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a 
structured silicon wafer surface

Kubowicz, S.; Thünemann, A. F.; Geue, T. M.; Pietsch, U.; Watson, Mark D.; Tchebotareva, N.; Müllen, Klaus

doi:10.1021/la035210e

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X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface

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Kubowicz, S.
Grenzflächen, Max Planck Institute of Colloids and Interfaces, Max Planck Society;

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Watson, Mark D.
MPI for Polymer Research, Max Planck Society;

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Tchebotareva, N.
MPI for Polymer Research, Max Planck Society;

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Müllen, Klaus
MPI for Polymer Research, Max Planck Society;

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Kubowicz, S., Thünemann, A. F., Geue, T. M., Pietsch, U., Watson, M. D., Tchebotareva, N., et al. (2003). X-ray reflectivity study of an amphiphilic hexa-peri-hexabenzocoronene at a structured silicon wafer surface. Langmuir, 19(26), 10997-10999. doi:10.1021/la035210e.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-63D3-3

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