English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Film-thickness dependence of structure formation in ultra-thin polymer blend films

MPS-Authors
/persons/resource/persons47980

Gutmann,  Jochen S.
MPI for Polymer Research, Max Planck Society;

External Ressource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Gutmann, J. S., Müller-Buschbaum, P., & Stamm, M. (2002). Film-thickness dependence of structure formation in ultra-thin polymer blend films. Applied Physics A, 74, S463-S465. doi:10.1007/s003390201855.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-647F-E
Abstract
We investigated the film-thickness dependence of structure formation in ultra-thin polymer blend films prepared from solution. As a model system we used binary blends of statistical poly(styrene-co-p-bromostyrene) copolymers of different degrees of bromination. Ultra-thin-film samples differing in miscibility and film thickness were prepared via spin coating of common toluene solutions onto silicon (100) substrates. The resulting morphologies were investigated with scanning force microscopy, reflectometry and grazing-incidence scattering techniques using both X-rays and neutrons in order to obtain a picture of the sample structure at and below the sample surface.