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Defect-induced perturbations of atomic monolayers on solid surfaces

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Schiessel,  H.
MPI for Polymer Research, Max Planck Society;

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Citation

Schiessel, H., Oshanin, G., Cazabat, A. M., & Moreau, M. (2002). Defect-induced perturbations of atomic monolayers on solid surfaces. Physical Review E, 66(5): 056130. doi:10.1103/PhysRevE.66.056130.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-64B4-1
Abstract
We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance above the substrate. Representing the monolayer in terms of a suitably extended Frenkel-Kontorova-type model, we calculate the defect-induced density profiles for several possible geometries. In case of an AFM tip, we also determine the extra force exerted on the tip due to the tip-induced dehomogenization of the monolayer.