Base-pair mapping by chemical force microscopy on nucleobase self-assembled 
monolayers

Ijiro, K.; Sunami, H.; Arai, K.; Matsumoto, J.; Karthaus, O.; Kraemer, S.; Mittler, Silvia; Nishi, N.; Juskowiak, B.; Takenaka, S.; Knoll, Wolfgang; Shimomura, M.

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Base-pair mapping by chemical force microscopy on nucleobase self-assembled monolayers

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Ijiro, K.
MPI for Polymer Research, Max Planck Society;

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Mittler, Silvia
MPI for Polymer Research, Max Planck Society;

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Knoll, Wolfgang
MPI for Polymer Research, Max Planck Society;

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引用

Ijiro, K., Sunami, H., Arai, K., Matsumoto, J., Karthaus, O., Kraemer, S., Mittler, S., Nishi, N., Juskowiak, B., Takenaka, S., Knoll, W., & Shimomura, M. (2002). Base-pair mapping by chemical force microscopy on nucleobase self-assembled monolayers. Colloids and Surfaces A-Physicochemical and Engineering Aspects, 198-200, 677-682.

引用: https://hdl.handle.net/11858/00-001M-0000-000F-6687-8

要旨

Self-assembled monolayers (SAMs) of double-chain disulfide derivatives of nucleobases (adenine and thymine) were formed on Au substrates in order to measure complementary hydrogen bonding by chemical force microscopy at the interfaces. Surface plasmon resonance measurements indicated that the formation of the nucleobase SAMs on Au surface was completed within 80 min. To measure adhesion force by atomic force microscopy (AFM), Au- coated AFM tips were modified with the nucleobase SAMs, too. SAM-modified An substrates micro-patterned on quartz substrates were prepared for adhesion force mapping. The adhesion force between the complementary nucleobases is larger than that of the non-complementary combination. Electrochemical detection using a redox-intercalator was demonstrated for hybridization of single-stranded polynucleic acid with the nucleobase SAMs modified on Au electrodes. (C) 2002 Elsevier Science B.V. All rights reserved.