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Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy

MPS-Authors
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Sun,  L.
MPI for Polymer Research, Max Planck Society;

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Wang,  J. J.
MPI for Polymer Research, Max Planck Society;

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Bonaccurso,  Elmar
MPI for Polymer Research, Max Planck Society;

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Sun, L., Wang, J. J., & Bonaccurso, E. (2010). Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy. Journal of Physical Chemistry C, 114(15), 7161-7168.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-720E-A
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