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Oscillation-induced static deflection in scanning force microscopy

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Heim,  Lars-Oliver
MPI for Polymer Research, Max Planck Society;

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Citation

Heim, L.-O., & Johannsmann, D. (2007). Oscillation-induced static deflection in scanning force microscopy. Review of Scientific Instruments, 78(1): 013902. doi:10.1063/1.2424445.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-7C4B-E
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