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Electron holography of thin amorphous carbon films: Measurement of the mean inner potential and a thickness-independent phase shift

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Tesche,  B.
Service Department Tesche (EM), Max-Planck-Institut für Kohlenforschung, Max Planck Society;
Service Department Tesche (EM), Max-Planck-Institut für Kohlenforschung, Max Planck Society;

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Wanner, M., Bach, D., Gerthsen, D., Werner, R., & Tesche, B. (2006). Electron holography of thin amorphous carbon films: Measurement of the mean inner potential and a thickness-independent phase shift. Ultramicroscopy, 106, 341-345. doi:10.1016/j.ultramic.2005.10.004.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-93CF-E
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