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Journal Article

Microscopic investigation of strain localization and fatigue damage in thin Cu films

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Zhang,  G. P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Volkert,  C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schwaiger,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Kraft,  O.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Zhang, G. P., Volkert, C. A., Schwaiger, R., & Kraft, O. (2005). Microscopic investigation of strain localization and fatigue damage in thin Cu films. Materials Science Forum, 475-479, 3647-3650.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-265E-5
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