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Local strains measured in Al lines during thermal cycling and electromigration using convergent-beam electron diffraction

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Nucci,  J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Krämer,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Volkert,  C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Nucci, J., Krämer, S., Arzt, E., & Volkert, C. A. (2005). Local strains measured in Al lines during thermal cycling and electromigration using convergent-beam electron diffraction. Journal of Materials Research, 20(7), 1851-1859.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-268A-1
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