Experimental evidence of the dominant role of low-angle grain boundaries for 
the critical current density in epitaxially grown YBCO thin films

Brück, S.; Albrecht, J.

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Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown YBCO thin films

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Brück, S.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Albrecht, J.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Brück, S., & Albrecht, J. (2005). Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown YBCO thin films. Physical Review B, 71: 174508.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-269E-6

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