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Analytical transmission electron microscopy

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Sigle, W. (2005). Analytical transmission electron microscopy. Annual Review of Materials Research, 35, 239-314.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-27C3-6
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