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Combined EELS, EDX, and STEM investigations of Cu-induced nanostrucutures and thin surface layer phases

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hollensteiner, S., Sigle, W., Spiecker, E., & Jäger, W. (2005). Combined EELS, EDX, and STEM investigations of Cu-induced nanostrucutures and thin surface layer phases. Zeitschrift für Metallkunde, 96, 888-893.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-283E-A
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