In Situ Tensile Testing at the Limits of X-Ray Diffraction – A new 
Synchrotron-Based Technique

Böhm, J.

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In Situ Tensile Testing at the Limits of X-Ray Diffraction – A new Synchrotron-Based Technique

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Böhm, J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Böhm, J. (2004). In Situ Tensile Testing at the Limits of X-Ray Diffraction – A new Synchrotron-Based Technique. PhD Thesis, Universität Stuttgart, Stuttgart.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2924-9

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