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Structure, morphology, and optical properties of thin film of F16CuPc grown on silicondioxide

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Ossó,  J. O.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schreiber,  F.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Barrena,  E.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Citation

Ossó, J. O., Schreiber, F., Alonso, M. I., Barrena, E., & Dosch, H. (2004). Structure, morphology, and optical properties of thin film of F16CuPc grown on silicondioxide. Organic Electronics, 5(1 - 3), 135-140.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-296E-7
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