Creep properties and texture of a high niobium containing gamma-TiAl sheet 
material

Bystrzanowski, S.; Bartels, A.; Gerling, R.; Schimansky, F.P.; Clemens, H.; Kestler, H.; Dehm, G.; Weller, M.

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Creep properties and texture of a high niobium containing gamma-TiAl sheet material

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Clemens, H.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm, G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Weller, M.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bystrzanowski, S., Bartels, A., Gerling, R., Schimansky, F., Clemens, H., Kestler, H., Dehm, G., & Weller, M. (2004). Creep properties and texture of a high niobium containing gamma-TiAl sheet material. In L., G., & A., J. (Eds.), Ti-2003 Science and Technology. Vol. 4 (pp. 2401-2408). Weinheim: Wiley-VCH Verlag GmbH.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-2AC5-8

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