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Existence of transient temperature spike induced by SHI: evidence by ion beam analysis

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Srivastava,  S. K.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Avasthi, D. K., Ghosh, S., Srivastava, S. K., & Assmann, W. (2004). Existence of transient temperature spike induced by SHI: evidence by ion beam analysis.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2B38-F
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