English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Conference Paper

A new synchrotron-based technique for measuring stresses in ultrathin metallic films

MPS-Authors
/persons/resource/persons75305

Böhm,  J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75533

Gruber,  P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76138

Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76263

Wanner,  A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75228

Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Böhm, J., Gruber, P., Spolenak, R., Wanner, A., & Arzt, E. (2004). A new synchrotron-based technique for measuring stresses in ultrathin metallic films. In P. Anderson, T. Foecke, A. Misra, & R. Rudd (Eds.), Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties (pp. P1.6.1-P1.6.6.). Warrendale, PA: Materials Research Society.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2BC5-F
Abstract
There is no abstract available