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Journal Article

Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

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Osso,  J. O.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schreiber,  F.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Barrena,  E.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Citation

Alonso, M. I., Garriga, M., Osso, J. O., Schreiber, F., Barrena, E., & Dosch, H. (2003). Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry. Journal of Chemical Physics, 119(12), 6335-6340.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2C3E-C
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