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Advances in sputter depth profiling using AES

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Hofmann,  S.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hofmann, S. (2003). Advances in sputter depth profiling using AES. Surface and Interface Analysis, 35(7), 556-563.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2C85-8
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