Local plasticity of Al thin films as revealed by X-ray microdiffraction

Spolenak, R.; Brown, W. L.; Tamura, N.; MacDowell, A. A.; Celestre, R. S.; Padmore, H. A.; Valek, B.; Bravman, J. C.; Marieb, T.; Fujimoto, H.; Batterman, B. W.; Patel, J. R.

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Local plasticity of Al thin films as revealed by X-ray microdiffraction

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Spolenak, R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Spolenak, R., Brown, W. L., Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Valek, B., Bravman, J. C., Marieb, T., Fujimoto, H., Batterman, B. W., & Patel, J. R. (2003). Local plasticity of Al thin films as revealed by X-ray microdiffraction. Physical Review Letters, 90(9):.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-2CF4-0

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