Internal stress measurements by high-energy synchrotron X-ray diffraction at 
increased specimen-detector distance

Böhm, J.; Wanner, A.; Kampmann, R.; Franz, H.; Liss, K.-D.; Schreyer, A.; Clemens, H.

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Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance

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Böhm, J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wanner, A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Clemens, H.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Böhm, J., Wanner, A., Kampmann, R., Franz, H., Liss, K.-D., Schreyer, A., et al. (2003). Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance. Nuclear Instruments and Methods in Physics Research B, 200, 315-322.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2D46-E

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