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Optimized preparation of cross-sectional TEM specimens of organic thin films

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Dürr,  A. C.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schreiber,  F.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Kelsch,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Dürr, A. C., Schreiber, F., Kelsch, M., & Dosch, H. (2003). Optimized preparation of cross-sectional TEM specimens of organic thin films. Ultramicroscopy, 98(1), 51-55.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2DD0-7
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