Advances in EELS spectroscopy by using new detector and new specimen 
preparation technologies

Scheu, C.; Gao, M.; van Benthem, K.; Tsukimoto, S.; Schmidt, S.; Sigle, W.; Richter, G.; Thomas, J.

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Advances in EELS spectroscopy by using new detector and new specimen preparation technologies

MPS-Authors

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Scheu, C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gao, M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Benthem, K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Tsukimoto, S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schmidt, S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle, W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Richter, G.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Thomas, J.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Scheu, C., Gao, M., van Benthem, K., Tsukimoto, S., Schmidt, S., Sigle, W., et al. (2003). Advances in EELS spectroscopy by using new detector and new specimen preparation technologies. Journal of Microscopy, 210, 16-24.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2DF9-D

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