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Electromigration in Metallization Layers

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Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Spolenak, R., Wendrock, H., & Wetzig, K. (2003). Electromigration in Metallization Layers. In K. Wetzig, & C. M. Schneider (Eds.), Metal Based Thin Films for Electronics (pp. 205-221). Weinheim: Wiley-VCH.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2E1B-8
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