Creep behavior and microstructural changes during short-term creep in a 
gamma-TiAl based alloy with fully lamellar microstructure

Chatterjee, A.; Clemens, H.; Dehm, G.; Mecking, H.; Arzt, E.

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Creep behavior and microstructural changes during short-term creep in a gamma-TiAl based alloy with fully lamellar microstructure

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Chatterjee, A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Clemens, H.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm, G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt, E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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引用

Chatterjee, A., Clemens, H., Dehm, G., Mecking, H., & Arzt, E. (2003). Creep behavior and microstructural changes during short-term creep in a gamma-TiAl based alloy with fully lamellar microstructure. In Y. W., Kim, & H. R., Clemens A. H. (Eds.), Gamma Titanium Aluminides 2003 (pp. 425-430). Warrendale, PA: TMS.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-2F2F-7

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