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Journal Article

Transmission electron microscopy study of a new silicon nitride phase

MPS-Authors
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Cai,  Y.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Zimmermann,  A.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Prinz,  S.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Krämer,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Phillipp,  F.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Aldinger,  F.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien;

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Citation

Cai, Y., Zimmermann, A., Prinz, S., Krämer, S., Phillipp, F., Sigle, W., et al. (2002). Transmission electron microscopy study of a new silicon nitride phase. Philosophical Magazine Letters, 82(10), 553-558.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2FF7-5
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