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Electron energy-loss near-edge structure studies at the atomic level: reliability of the spatial difference technique

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Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Scheu, C. (2002). Electron energy-loss near-edge structure studies at the atomic level: reliability of the spatial difference technique. Journal of Microscopy-Oxford, 207, 52-57.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-308C-0
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