Creep behavior of γ -TiAl sheet material with differently spaced fully lamellar 
microstructures

Chatterjee, A.; Mecking, H.; Arzt, E.; Clemens, H.

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Creep behavior of γ -TiAl sheet material with differently spaced fully lamellar microstructures

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Chatterjee, A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt, E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Clemens, H.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Chatterjee, A., Mecking, H., Arzt, E., & Clemens, H. (2002). Creep behavior of γ -TiAl sheet material with differently spaced fully lamellar microstructures. Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing, 329(Sp. Iss. SI), 840-846.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-30D9-F

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