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Conference Paper

The SESAM Project - Present State and Applications

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Krämer,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Zern,  A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Cai,  Y.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Eigenthaler,  U.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Scientific Staff Assembly Dual Beam, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hahn,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Sigle, W., Krämer, S., Zern, A., Cai, Y., Eigenthaler, U., Hahn, K., et al. (2002). The SESAM Project - Present State and Applications. In J. Engelbrecht, T. Sevell, M. Witcomb, R. Cross, & P. Richards (Eds.), Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1 (pp. 329-330). Onderstepoort: Microscopy Society of Southern Africa.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-32B2-6
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