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The SESAM Project - Present State and Applications

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/persons/resource/persons76113

Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75711

Krämer,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76317

Zern,  A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75340

Cai,  Y.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Eigenthaler,  U.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Scientific Staff Assembly Dual Beam, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75551

Hahn,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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引用

Sigle, W., Krämer, S., Zern, A., Cai, Y., Eigenthaler, U., Hahn, K., & Rühle, M. (2002). The SESAM Project - Present State and Applications. In J., Engelbrecht, T., Sevell, M., Witcomb, R., Cross, & P., Richards (Eds.), Proceedings of the 15th International Congress on Electron Microscopy. Vol. 1 (pp. 329-330). Onderstepoort: Microscopy Society of Southern Africa.


引用: https://hdl.handle.net/11858/00-001M-0000-0010-32B2-6
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