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High resolution microdiffraction studies using synchrotron radiation

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Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Spolenak, R., Tamura, N., Valek, B. C., MacDowell, A. A., Celestre, R. S., Padmore, H. A., et al. (2002). High resolution microdiffraction studies using synchrotron radiation. In S. Baker, M. Korhonen, E. Arzt, & P. Ho (Eds.), Stress Induced Phenomena in Metallization (pp. 217-228). Melville, N.Y.: AIP.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3360-5
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