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Focussed ion beam methods applied to biological materials: sample preparation and investigation

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Wegst,  U. G. K.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Heiland,  B.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Wegst, U. G. K., Heiland, B., & Arzt, E. (2002). Focussed ion beam methods applied to biological materials: sample preparation and investigation. In J. Engelbrecht, T. Sevell, M. Witcomb, R. Cross, & P. Richards (Eds.), Proceedings of the 15th International Congress on Electron Microscopy (ICEM 15). Vol. 1. Physics and Materials (pp. 607-608). Onderstepoort: Microscopy Society of Southern Africa.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3379-F
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