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Advances in energy-filtering transmission electron microscopy

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Zern,  A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hahn,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Eigenthaler,  U.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Scientific Staff Assembly Dual Beam, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Sigle, W., Zern, A., Hahn, K., Eigenthaler, U., & Rühle, M. (2001). Advances in energy-filtering transmission electron microscopy. Journal of Electron Microscopy, 50(6), 509-515.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3618-D
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